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SQM160

Features
The SQM-160 measures thickness and deposition rate of the thin film deposition process. The base unit can monitor from 2 independent measurement channels. Four relays are available to control source and crystal shutters during the deposition process. Upto nine films can be stored in memory in the SQM-160, active film can be easily changed from the front panel. All parameters can also be set from the front panel of the monitor. The SQM-160 is a monitor only. It is not capable of controlling the rate during deposition.

SQM160 Manual .pdf file (453 kb)
SQM160-Brochure .pdf file (618 kb)

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