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Product > Thin Film Deposition > Control and Measurement
 
Thin Film Deposition
Control and Measurement - Deposition Control & Measurement
SQM160SQC122SQC222
SQM242Crystal Sensor PackagesXL12 Multi Crystal Sensor Head
SQC122 Thin Film Deposition Control and Measurement &

Features
The SQM-122 controls deposition rate and thickness in multi-layer thing film deposition processes. The controller was desined for ease of use with six content sensetive Softkeys providing rapid access to frequently used data. The 122C memory will hold up to 25 processes consisting of 250 layers and 25 materials. Cut/ Copy /Paste capabilities make it easy to modify or duplicate processes and layers. The controller has inputs for two crystal sensors, two 0-10 volt outputs are available to control the evaporation rate. Eight relays and digital inputs can be independently assigned to over 40 possible events, including pocket rotation and external processes controls. A window program for set up and data acquisition is also included with the controller.


SQC122 Datasheet .pdf file (116 kb)
SQC122 Brochure .pdf file (285 kb)

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