SQM160 Thin Film Deposition Control and Measurement &

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Thin Film Deposition
Control and Measurement - Deposition Control & Measurement

	SQM160	SQC122	SQC222
	SQM242	Crystal Sensor Packages	XL12 Multi Crystal Sensor Head

SQM160 Thin Film Deposition Control and Measurement &

Features

The SQM-160 measures thickness and deposition rate of the thin film deposition process. The base unit can monitor from 2 independent measurement channels. Four relays are available to control source and crystal shutters during the deposition process. Upto nine films can be stored in memory in the SQM-160, active film can be easily changed from the front panel. All parameters can also be set from the front panel of the monitor. The SQM-160 is a monitor only. It is not capable of controlling the rate during deposition.

SQM160 Manual .pdf file (453 kb)
SQM160-Brochure .pdf file (618 kb)

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DESCRIPTION	WT LBS	Part Number	UOM	List Price	Net Price	Lead Time	Qty
SQM-160 Two channel deposition monitor	10	991366 TWO CHANNEL DEPOSITION MONITOR	EACH	---- Call 510-265-3500 ----

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